1. The Impact of Correlated Metrics on the Interpretation of Defect Models

    Jirayus Jiarpakdee, Chakkrit Tantithamthavorn, and Ahmed E. Hassan
    IEEE Transactions on Software Engineering (TSE)
    2019
    PDF
  2. Mining Software Defects: Should We Consider Affected Releases?

    Suraj Yatish, Jirayus Jiarpakdee, Patanamon Thongtanunam, Chakkrit Tantithamthavorn
    The International Conference on Software Engineering (ICSE)
    2019
    21% (109/529)
    PDF
  3. The Impact of Class Rebalancing Techniques on the Performance and Interpretation of Defect Prediction Models

    Chakkrit Tantithamthavorn, Ahmed E. Hassan, and Kenichi Matsumoto
    IEEE Transactions on Software Engineering (TSE)
    2019
    PDF
  4. The Impact of Automated Parameter Optimization on Defect Prediction Models

    Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, and Kenichi Matsumoto
    IEEE Transactions on Software Engineering (TSE)
    2019
    PDF