1. An Empirical Comparison of Model Validation Techniques for Defect Prediction Models


    Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, and Kenichi Matsumoto
    IEEE Transactions on Software Engineering (TSE)
    2017
    PDF
  2. Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"

    Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, and Kenichi Matsumoto
    IEEE Transactions on Software Engineering (TSE)
    2016
    PDF