01 January 2019

Jirayus Jiarpakdee, Chakkrit Tantithamthavorn, and Ahmed E. Hassan

IEEE Transactions on Software Engineering (TSE)

—Defect models are analytical models for building empirical theories related to software quality. Prior studies often derive knowledge from such models using interpretation techniques, e.g., ANOVA Type-I. Recent work raises concerns that correlated metrics may impact the interpretation of defect models. Yet, the impact of correlated metrics in such models has not been investigated. In this paper, we investigate the impact of correlated metrics on the interpretation of defect models and the improvement of the interpretation of defect models when removing correlated metrics. Through a case study of 14 publicly- available defect datasets, we find that (1) correlated metrics have the largest impact on the consistency, the level of discrepancy, and the direction of the ranking of metrics, especially for ANOVA techniques. On the other hand, we find that removing all correlated metrics (2) improves the consistency of the produced rankings regardless of the ordering of metrics (except for ANOVA Type-I); (3) improves the consistency of ranking of metrics among the studied interpretation techniques; (4) impacts the model performance by less than 5 percentage points. Thus, when one wishes to derive sound interpretation from defect models, one must (1) mitigate correlated metrics especially for ANOVA analyses; and (2) avoid using ANOVA Type-I even if all correlated metrics are removed.


    Author={Jiarpakdee, Jirayus and Tantithamthavorn, Chakkrit and Hassan, Ahmed E.},
    Title = {The Impact of Correlated Metrics on
the Interpretation of Defect Models},
    Booktitle = {IEEE Transactions on Software Engineering (TSE)},
    page = {In Press},
    Year = {2019}